STEP PROBE

STEP PROBE 



FINE PITCH

SEMICONDUCTOR TEST SOLUTION

SEMICONDUCTOR TEST PROBES SOLUTION

A wide range of Semiconductor test probes from JYPROBE Electronics provide final package test( BGA, QFN, LGA etc), RF test and fixture designing industries and factories outstanding opportunities to meet customers' great and challenging requirements. We have from 0.17mm( 0.006'') diameter fine pitch probes to 1.0mm( 0.039'') large pitch probes.

QFN SOCKET
STEP PROBE
POWER SOCKET
BGEA socket
HIGH SPEED PROBES
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KELVIN PROBE PINS
PITCH 0.17-0.25MM

STANDARD


HIGH-SPEED PROBE



KELVIN PROBE



SEMICONDUCTOR TEST SOCKET SOLUTION

JYPROBE offers a wide range of spring contacts socket and design standards for high quality test sockets providing flexibility and fast delivery for optimal cost/performance ratio.

LGA SOCKET
PITCH 0.3MM-1.0MM

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