A Kelvin test socket is a type of socket that uses Kelvin (or four-wire) measurement to test the resistance of semiconductor devices with high accuracy and low contact resistance. It uses dual independent spring probes for each device pad, one for current injection and one for voltage measurement. Kelvin test sockets are suitable for testing CSP, µBGA, Bump-Array, QFN, QFP, MLF, DFN, SSOP, TSSOP, TSOP, SOP, SOIC, LGA, LCC, PLCC, TO and any SMT package style. They are also compatible with PGA packaged devices. One of the manufacturers of Kelvin test sockets is JYPROBE, which offers a range of standard and customized solutions based on spring loaded probe technology. Their Kelvin spring probes can be used for low pitch applications down to 0.35 mm.
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