SEMICONDUCTOR TEST PROBES
JYPROBE offers semiconductor test probes also spring contact probes and pogo pins range from 0.30mm-2.00mm test pitches. Catagories into single-ended probes, double-ended probes.
Applications
Memory Test, namely tests on semiconductor memory series final package products such as DRAM, LPDDR, Flash Memory, etc. JYPROBE offers high precision semiconductor test probes girding from 0.25mm on those memory test sockets.
Logic Test, is packaged as BGA or QFN on automotive electronics, CPU, GPU, RF, Touch Sensor, mixed signals and Non memory semiconuctor test. JYPROBE correspondingly developed the long life spring contact probes as a logic test socket solution.
High-Frequency Test is required into high allowable current and matched impedance with high fequency test, RF semiconductor test probes are specially designed diamension to suit the impedance require of the test socket. JYPROBE is making spring test probes as low and stable resistance on high RF performance.
Our semiconductor probes can work on High-Speed Transmission, Radio Frequency, Burn-In, Open-Short, High Current, High-Temperature environments.
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A506 No. 1000, Jiujing Road
Songjiang, Shanghai, China.
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