ICT TEST PROBES

In the manufacturing process of loaded printed circuit board, many components are implanted or welded onto the circuit boards, afterall a large number of electrical signal problems needs to be detected. The test probes are made to test in-circuit test or functional test. At the same time, our test probes are not only used to test the open and short, but also can detect the height in some situation, and detect the functions of the PCBs.

JYPROBE offers a wide range of spring contact probes on In-circuit test and functional test, the test probes are grided from 1mm(0.039'') to 4.75mm(0.187''), mated with receptacles mounting on the test fixtures. Over 50 head tips can be selected on the board side testing. A variety of spring forces can be selected for different test situations.

We provides short stroke and long stroke test probes on 39mil/ 50mil/ 75mil/ 100mil/ 125mil/156mil/ 187mil/ 189mil grids,  the special test probes can be customized as well.

Applications

• ​Standard open or short test,  JYPROBE offers the test probes for circuit test probe to detect the circuit line issue on open and short. Garantee the fail PCBs can be detected.
• Pin Height issue is still needed to be detected by spring contact probes in harness plugs, the spring contact probes can help pick out the shorter or longer pin in the harness plug. 
• One-time test on test different height components is helping manufacturing industries save time. Usually the short and long test probes are used on same test fixture to make a one-time test on in-circuit test or functional test.

• ​Contact a varity of Contact Components, Dip, Via Holes and Pads Test, JYPROBE offers a mass of test probe tip to contact components or points on PCBs.
• Pad on Trance test is still a commone test situation on In-circuit test, bead test probes are good choice.

Conventional spring contact probes are available as below.  

Need a free cross or quote, contact us sales@jyprobe.com